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  • Produktbild: Advances in X-ray Analysis
  • Produktbild: Advances in X-ray Analysis

Advances in X-ray Analysis Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9–11, 1967 Volume 11

148,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

10.10.2013

Verlag

Springer Us

Seitenzahl

499

Maße (L/B/H)

25,4/17,8/2,8 cm

Gewicht

992 g

Auflage

Softcover reprint of the original 1st ed. 1968

Sprache

Englisch

ISBN

978-1-4684-8678-0

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

10.10.2013

Verlag

Springer Us

Seitenzahl

499

Maße (L/B/H)

25,4/17,8/2,8 cm

Gewicht

992 g

Auflage

Softcover reprint of the original 1st ed. 1968

Sprache

Englisch

ISBN

978-1-4684-8678-0

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: GPSR Kontakt

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  • Produktbild: Advances in X-ray Analysis
  • Produktbild: Advances in X-ray Analysis
  • Recent Advances in Quantitative X-Ray Spectrometric Analysis by Solution Techniques.- X-Ray Fluorescence Spectroscopy in the Analysis of Ores, Minerals, and Waters.- Common Sources of Error in Electron Probe Microanalysis.- X-Ray Spectrographic Analysis of Traces in Metals by Preconcentration Techniques.- Theoretical Correction for Coexistent Elements in Fluorescent X-Ray Analysis of Alloy Steel.- Micro Fluorescent X-Ray Analyzer.- Use of Primary Filters in X-Ray Spectrography: A New Method for Trace Analysis.- Precision and Accuracy of Silicate Analyses by X-Ray Fluorescence.- Applications of Computerized Statistical Techniques in Quantitative X-Ray Analysis.- X-Ray Fluorescence Analysis of a Manganese Ore.- Total Nondestructive Analysis of CAAS Syenite.- X-Ray Fluorescence of Suspended Particles in a Liquid Hydrocarbon.- The Effect of Surface Roughness in Polymers on X-Ray Fluorescence Intensity Measurements.- Production Control of Gold and Rhodium Plating Thickness on Very Small Samples by X-Ray Spectroscopy.- A Study of X-Ray Fluorescence Method with Vacuum and Air-Path Spectrographs for the Determination of Film Thicknesses of II-VI Compounds.- Rare-Earth Analyses by X-Ray-Excited Optical Fluorescence.- Nondispersive X-Ray Fluorescent Spectrometer.- The Influence of Sample Self-Absorption on Wavelength Shifts and Shape Changes in the Soft X-Ray Region: The Rare-Earth M Series.- The X-Ray Wavelength Scale in the Long-Wavelength Region.- Applications of a Portable Radioisotope X-Ray Fluorescence Spectrometer to Analysis of Minerals and Alloys.- The Application of Radioisotope Nondispersive X-Ray Spectrometry to the Analysis of Molybdenum.- Quantitative Microprobe Analysis of Thin Insulating Films.- The Effect of Microsegregation on the Observed Intensity in Thin-Film Microanalysis.- Multistep Intensity Indication in Scanning Microanalysis.- Investigation and Demonstration of Single-Crystal and Powder Diffraction by Using Zero-Power Beta-Excited X-Ray and 55Fe Isotopic Sources.- An X-Ray Small-Angle Scattering Instrument.- Study of Extended X-Ray Absorption Fine Structure with the Use of Thick Targets.- Determination of Lattice Parameters by the Kossel and Divergent X-Ray Beam Techniques.- Fully Automated High-Precision X-Ray Diffraction.- Computerized Multiphase X-Ray Powder-Diffraction Identification System.- Measurement of Elastic Strains in Crystal Surfaces by X-Ray Diffraction Topography.- X-Ray Double-Crystal Method of Analyzing Microstrains with BeO Single Crystals.- X-Ray Stress Measurement by the Single-Exposure Technique.- Residual Stress and Shape Distortion in High-Strength Tool Steels.- Irradiation Effects in Some Crystalline Ceramics.- An X-Ray Diffraction Study of the Aging Reaction in Two Austenitic Alloys.- A Simplified Method of Quantitating Preferred Orientation.- Crystallite Orientation Analysis for Rolled Cubic Materials.- Topotactical Relationships Between Hematite ?-Fe2O3 and the Magnetite Fe3O4 Which is Formed on It by Thermal Decomposition under Low Oxygen Pressure.- Crystal Structure Analysis of Niobium-Doped Rutile Single Crystal.- Author Index.