Advances in X-Ray Analysis Volume 37
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- Hardcover
- Taschenbuch ausgewählt
- eBook
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Sprache:Englisch
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Auflage:Softcover reprint of the original 1st ed. 1994
- Softcover reprint of the original 1st ed. 1984 51,99 €
- Softcover reprint of the original 1st ed. 1962 49,99 €
- Softcover reprint of the original 1st ed. 1961 96,99 €
- Softcover reprint of the original 1st ed. 1982 51,99 €
- Softcover reprint of the original 1st ed. 1960 49,99 €
- Softcover reprint of the original 1st ed. 1960 49,99 €
- Softcover reprint of the original 1st ed. 1988 51,99 €
- Softcover reprint of the original 1st ed. 1987 51,99 €
- Softcover reprint of the original 1st ed. 1965 49,99 €
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- Softcover reprint of the original 1st edition 1990 49,99 €
- Softcover reprint of the original 1st ed. 1985 51,99 €
- 1991 51,99 €
- Softcover reprint of the original 1st ed. 1963 49,99 €
- Softcover reprint of the original 1st ed. 1969 51,99 €
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- Softcover reprint of the original 1st ed. 1994 49,99 € ausgewählt
- Softcover reprint of the original 1st ed. 1993 51,99 €
- Softcover reprint of the original 1st ed. 1992 49,99 €
- 1966 51,99 €
49,99 €
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
05.11.2012
Herausgeber
John V. Gilfrich + weitereVerlag
Springer UsSeitenzahl
756
Maße (L/B/H)
25,4/17,8/4,2 cm
Gewicht
1446 g
Auflage
Softcover reprint of the original 1st ed. 1994
Sprache
Englisch
ISBN
978-1-4613-6077-3
The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size and flavor of the Conference has changed over the years, so too have the methods and techniques of x-ray materials analysis matured. Science is advanced by the creativity of a few and the mistakes of many. It is important, therefore, that from time to time we sit back and reflect on how we got where we are, and where we are likely to go next. There has been no greater impact on the field than the introduction of the digital computer, and the Plenary Session of the 1993 Conference, "Impact of the PC in X-Ray Analysis," was designed to reflect on the role of the personal computer in the metamorphosis of x-ray instrumentation and techniques. Since the personal computer is a creation of non-x-ray specialists, we, as a group, have simply attached ourselves to the coat-tails of experts and developers in the PC field and taken advantage of new computer systems as and when they were developed.
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