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Produktbild: Advances in X-Ray Analysis
Band 5

Advances in X-Ray Analysis Proceedings of the Tenth Annual Conference on Application of X-Ray Analysis Held August 7–9, 1961

Aus der Reihe Advances in X-Ray Analysis

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

08.10.2012

Verlag

Springer Us

Seitenzahl

564

Maße (L/B/H)

25,4/17,8/3,2 cm

Gewicht

1076 g

Auflage

Softcover reprint of the original 1st ed. 1962

Sprache

Englisch

ISBN

978-1-4684-7608-8

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

08.10.2012

Verlag

Springer Us

Seitenzahl

564

Maße (L/B/H)

25,4/17,8/3,2 cm

Gewicht

1076 g

Auflage

Softcover reprint of the original 1st ed. 1962

Sprache

Englisch

ISBN

978-1-4684-7608-8

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: GPSR Kontakt

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  • Produktbild: Advances in X-Ray Analysis
  • Twenty Years of Progress in X-Ray Diffraction Techniques.- Crystal Structure and Stability of Refractory Phases.- X-Ray Diffraction Studies at Low Temperatures.- Low Temperature X-Ray Diffraction of Frozen Electrolytes.- The Lattice Parameters of Iron-Ruthenium Solid-Solution Alloys.- X-Ray Diffraction Investigation of the Sn-Hg Phase in Dental Amalgam.- Determination of Accurate Lattice Parameters Using a Diffractometer.- Precision Lattice-Parameter Determination by Double-Scanning Diffractometry.- Some Recent Developments in the Direct Viewing and High-Speed Recording of X-Ray Diffraction Lines.- The Determination of Crystallite Size and Size Distribution from Broadened X-Ray Diffraction Lines.- Routine Crystallite-Size Determination by X-Ray Diffraction Line Broadening.- A Study of Cuban Todorokite.- X-Ray Studies on the Formation of Basic Lead Azides.- X-Ray Investigations on Some Salts of Hydrazine and Hydrazine Derivatives.- Determination of Zinc Sulfide and Cadmium Sulfide in Solid Solutions of Small Single Crystals Used for Semiconductors by X-Ray and Chemical Methods.- Method for Finding Mass Absorption Coefficients by Empirical Equations and Graphs.- X-Ray Studies of Preferred Orientations and Stress-Strain Relations in Rapidly Deformed Copper.- High Temperature Furnaces for X-Ray Diffractometers.- Selected Applications of High Temperature X-Ray Studies in the Metallurgical Field.- A High Temperature X-Ray Diffractometer Specimen Holder.- Alignment Device and Thermal Control System for High-Temperature X-Ray Diffractometry.- Problems in the Temperature Calibration of an X-Ray Diffractometer Furnace.- Determination of Thermal Expansion by High-Temperature X-Ray Diffraction.- Thermal Expansion of Alpha-Alumina.- Use of a High-Temperature X-Ray Diffractometer to Measure the Temperature Dependence of Reflection Intensities.- Effect of Impurities on Kaolinite Transformations as Examined by High Temperature X-Ray Diffraction.- The Application of X-Ray Diffraction at Elevated Temperatures to Study the Mechanism of Formation of Sodium Tripolyphosphate.- Microanalysis with Ultrasoft X-Radiations.- A Weighted Least Squares Parametric Method of Reducing Nuclear-Reactor Gamma Spectral Data.- Projection Microscopy and Microanalyses.- Heterogeneity Effects in X-Ray Analysis.- The Geometrical Representation of Ternary Alloys and Its Applications to X-Ray Fluorescence and Microprobe Analysis.- Some Considerations on the Excitation Efficiency in X-Ray Spectro-chemical Analysis.- X-Ray Absorption-Edge Determination of Cobalt in Complex Mixtures.- A Simple Multielement-Calibration System for Analysis of Minor and Major Elements in Minerals by Fluorescent X-Ray Spectrography.- Surface Preparation of Solid Metallic Samples for X-Ray Spectro-chemical Analysis.- A Test of the Precision and Sources of Error in Quantitative Analysis of Light, Major Elements in Granitic Rocks by X-Ray Spectrography.- Precision of X-Ray Emission Measurements in the Determination of Low Alloy Steels with an X-Ray Spectrograph.- Determination of Trace Elements in Plant Material by Fluorescent X-Ray Analysis.- Some Special Sample-Mounting Devices for the X-Ray Fluorescence Spectrometer.- The Application of X-Rays to the Analysis of Container Glass.- On Line Type X-Ray Emission Analyzer Systems.- Vacuum X-Ray Instrumentation and Its Application to Mill-Products Control.- Application of X-Ray Fluorescence Analysis to Process Control.- Thin Film X-Ray Spectroscopy.- The X-Ray Spectrographic Analysis of Thin Films by the Milliprobe Technique.- X-Ray Probe with Collimation of the Secondary Beam.- Electron Probe X-Ray Spectrograph: Design, Evaluation, and Application.- Equipment for Beam Scanning and Step Scanning in Electron Probe Analysis.- Author Index.