Advances in X-Ray Analysis Proceedings of the Eleventh Annual Conference on Application of X-Ray Analysis Held August 8–10, 1962
Aus der Reihe
Advances in X-Ray Analysis
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- Hardcover
- Taschenbuch ausgewählt
- eBook
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Sprache:Englisch
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Auflage:Softcover reprint of the original 1st ed. 1963
- Softcover reprint of the original 1st ed. 1984 51,99 €
- Softcover reprint of the original 1st ed. 1962 49,99 €
- Softcover reprint of the original 1st ed. 1961 96,99 €
- Softcover reprint of the original 1st ed. 1982 51,99 €
- Softcover reprint of the original 1st ed. 1960 49,99 €
- Softcover reprint of the original 1st ed. 1960 49,99 €
- Softcover reprint of the original 1st ed. 1988 51,99 €
- Softcover reprint of the original 1st ed. 1987 51,99 €
- Softcover reprint of the original 1st ed. 1965 49,99 €
- Softcover reprint of the original 1st ed. 1964 95,99 €
- Softcover reprint of the original 1st edition 1990 49,99 €
- Softcover reprint of the original 1st ed. 1985 51,99 €
- 1991 51,99 €
- Softcover reprint of the original 1st ed. 1963 49,99 € ausgewählt
- Softcover reprint of the original 1st ed. 1969 51,99 €
- Softcover reprint of the original 1st ed. 1967 49,99 €
- Softcover reprint of the original 1st ed. 1994 49,99 €
- Softcover reprint of the original 1st ed. 1993 51,99 €
- Softcover reprint of the original 1st ed. 1992 49,99 €
- 1966 51,99 €
49,99 €
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
02.06.2012
Verlag
Springer UsSeitenzahl
480
Maße (L/B/H)
25,4/17,8/2,7 cm
Gewicht
924 g
Auflage
Softcover reprint of the original 1st ed. 1963
Sprache
Englisch
ISBN
978-1-4684-8785-5
The torrential flow of technical information appearing in the world sources of literature is creating concern and apprehension among scientific people at all levels. It is extremely difficult to keep abreast of information flowing into a specific field. It is nearly impossible to transcend traditional confines of individual disciplines and put to effective use all pertinent information which stems from continuously increased trans disciplinary research. At the same time the researcher is faced with problems of in creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest. This is readily observed with X-ray analysis, where the chemist, physicist, metallurgist, and engineer are each faced with the solution of problems peculiar to specific disciplines but where solutions frequently correlate with the particular needs of the others. The Annual Conference on Applications of X-Ray Analysis and the subsequent Advances in X-Ray Analysis contribute to better understanding of multidisciplinary accomplishments; they are a ready source of information for the researcher who must undertake an abrupt change in emphasis for new objectives. The scope of this conference is broad--concerning itself, as it does, with latest developments in high-temperature and cryogenic techniques, phase equilibria, crystal structures, polymers, microprobes, and new developments in instrumentation.
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