KI-Beratung Beta

Beschreibung

Advances in Imaging and Electron Physics, Volume 203, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at...

Beschreibung

Advances in Imaging and Electron Physics, Volume 203, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Portrait

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

22.09.2017

Herausgeber Peter W. Hawkes
Verlag Elsevier Science & Technology

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

22.09.2017

Herausgeber Peter W. Hawkes
Verlag Elsevier Science & Technology
Seitenzahl

212

Maße (L/B/H)

22,9/15,2/1,3 cm

Gewicht

450 g

Sprache

Englisch

ISBN

978-0-12-812087-3

EU-Ansprechpartner

Elsevier B.V.
Radarweg 29
1043 NX Amsterdam
NL
productsafety@elsevier.com

Herstelleradresse

Elsevier Science & Technology
London Wall 125
EC2Y 5AS London
GB
tradeorders@elsevier.com

Noch keine Bewertungen vorhanden

Verfassen Sie die erste Bewertung zu diesem Artikel

Helfen Sie anderen Kundinnen und Kunden durch Ihre Meinung.

Kundinnen und Kunden meinen

Bewertungen (0)

Die Leseprobe wird geladen.
  • Produktbild: Advances in Imaging and Electron Physics
  • 1. Convolution in (max; min)-Algebra and Its Role in Mathematical Morphology
    Jesús Angulo
    2. Critical Magnetic Field and Its Slope, Specific Heat, and Gap for Superconductivity as Modified by Nanoscopic Disorder
    Clifford M. Krowne
    3. Mirror Electron Microscopy
    A. B. Bok, J. B. le Poole, J. Roos and H. de Lang