Produktbild: Applied Scanning Probe Methods II
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Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.02.2010

Abbildungen

XLIII, 420 p.

Herausgeber

Bharat Bhushan + weitere

Verlag

Springer Berlin

Seitenzahl

420

Maße (L/B/H)

23,5/15,5/2,5 cm

Gewicht

698 g

Auflage

Softcover reprint of hardcover 1st edition 2006

Sprache

Englisch

ISBN

978-3-642-06569-9

Beschreibung

Rezension

From the reviews:



"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)

Portrait

Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.02.2010

Abbildungen

XLIII, 420 p.

Herausgeber

Verlag

Springer Berlin

Seitenzahl

420

Maße (L/B/H)

23,5/15,5/2,5 cm

Gewicht

698 g

Auflage

Softcover reprint of hardcover 1st edition 2006

Sprache

Englisch

ISBN

978-3-642-06569-9

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: ProductSafety@springernature.com

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  • Produktbild: Applied Scanning Probe Methods II
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