Fundamentals of Electromigration-Aware Integrated Circuit Design

This book is very well suited for both engineering students and professionals. Starting from the basics of electromigration, it provides a general understanding of the matter before focussing on various aspects of EM-aware IC-design. It introduces EM verification methods as well as effective countermeasures to increase the reliability of the IC. Moreover, current research objectives are addressed. There are numerous illustrations and examples that help the reader to follow the explanations.