KI-Beratung Beta

Produktbild: Rietveld Refinement
- 11%

Rietveld Refinement Practical Powder Diffraction Pattern Analysis using TOPAS

Aus der Reihe De Gruyter STEM
11% sparen

87,99 € UVP 99,95 €

inkl. gesetzl. MwSt., Versandkostenfrei


Beschreibung

Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although...

Beschreibung

Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.

Rezension

"Dinnebier, Leineweber and Evans have done an outstanding job of explaining the fundamentals of the method and summarizing the exciting new developments. With this book, the reader can find answers to two questions: what information is stored in a powder diffraction pattern, and how to extract that information using TOPAS. I particularly like this combination of theory and practice and I wholeheartedly recommend this excellent read to any user of the powder diffraction method."

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

17.12.2018

Abbildungen

20 b/w and 10 col. ill.

Verlag De Gruyter

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

17.12.2018

Abbildungen

20 b/w and 10 col. ill.

Verlag De Gruyter
Seitenzahl

331

Maße (B/H)

17/24 cm

Gewicht

655 g

Auflage

1

Sprache

Englisch

ISBN

978-3-11-045621-9

Herstelleradresse

de Gruyter, Walter, GmbH
Genthiner Str. 13
10785 Berlin
Deutschland
Email: orders-books@degruyter.com
Url: www.degruyter.de
Telephone: +49 30 260050
Fax: +49 30 26005251

Noch keine Bewertungen vorhanden

Verfassen Sie die erste Bewertung zu diesem Artikel

Helfen Sie anderen Kundinnen und Kunden durch Ihre Meinung.

Kundinnen und Kunden meinen

Bewertungen (0)

Die Leseprobe wird geladen.
  • Produktbild: Rietveld Refinement
  • - Basics of powder diffraction
    - The Rietveld formula
    - Whole Powder Pattern Fitting (Pawley, LeBail, Rietveld)
    - Concept of Convolution
    - Deriving the instrumental resolution function
    - Global versus local optimization
    - Structure determination
    - Fourier analysis
    - Isotropic and anisotropic microstructural properties
    - Rigid bodies, constraints, restraints
    - Sequential versus parametric Rietveld refinement
    - Symmetry and rotational modes
    - Modelling stacking faults
    - Quantitative phase analysis
    - Determination of amorphous content
    - Agreement factors
    - Macro programming