KI-Beratung Beta

Produktbild: Principles of Electron Optics, Volume 1
- 13%

Principles of Electron Optics, Volume 1 Basic Geometrical Optics

13% sparen

191,99 € UVP 221,10 €

inkl. gesetzl. MwSt., Versandkostenfrei


Beschreibung

Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning...

Beschreibung

Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices.

The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics.

The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

29.10.2017

Verlag Elsevier Science & Technology
Seitenzahl

728

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

29.10.2017

Verlag Elsevier Science & Technology
Seitenzahl

728

Maße (L/B/H)

23,8/19,2/4,2 cm

Gewicht

1464 g

Auflage

2nd edition

Sprache

Englisch

ISBN

978-0-08-102256-6

Herstelleradresse

Libri GmbH
Europaallee 1
36244 Bad Hersfeld
DE

Email: gpsr@libri.de

Noch keine Bewertungen vorhanden

Verfassen Sie die erste Bewertung zu diesem Artikel

Helfen Sie anderen Kundinnen und Kunden durch Ihre Meinung.

Kundinnen und Kunden meinen

Bewertungen (0)

Die Leseprobe wird geladen.
  • Produktbild: Principles of Electron Optics, Volume 1
  • 1. Introduction

    PART I - CLASSICAL MECHANICS

    2. Relativistic Kinematics
    3. Different Forms of Trajectory Equations
    4. Variational Principles
    5. Hamiltonian Optics

    PART II - CALCULATION OF STATIC FIELDS

    6. Basic Concepts and Equations
    7. Series Expansions
    8. Boundary-Value Problems
    9. Integral Equations
    10. The Boundary-Element Method
    11. The Finite-Difference Method (FDM)
    12. The Finite-Element Method (FEM)
    13. Field-Interpolation Techniques

    PART III - THE PARAXIAL APPROXIMATION

    14. Introduction
    15. Systems with an Axis of Rotational Symmetry
    16. Gaussian Optics of Rotationally Symmetric Systems: Asymptotic Image Formation
    17. Gaussian Optics of Rotationally Symmetric Systems: Real Cardinal Elements
    18. Electron Mirrors
    19. Quadrupole Lenses
    20. Cylindrical Lenses

    PART IV - ABERRATIONS

    21. Introduction
    22. Perturbation Theory: General Formalism
    23. The Relation Between Permitted Types of Aberration and System Symmetry
    24. The Geometrical Aberrations of Round Lenses
    25. Asymptotic Aberration Coefficients
    26. Chromatic Aberrations
    27. Aberration Matrices and the Aberrations of Lens Combinations
    28. The Aberrations of Mirrors and Cathode Lenses
    29. The Aberrations of Quadrupole Lenses and Octopoles
    30. The Aberrations of Cylindrical Lenses
    31. Parasitic Aberrations

    PART V - DEFLECTION SYSTEMS

    32. Paraxial Properties of Deflection Systems
    33. The Aberrations of Deflection Systems

    PART VI - COMPUTER-AIDED ELECTRON OPTICS

    34. Numerical Calculation of Trajectories, Paraxial Properties and Aberrations