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  • Produktbild: Atom Probe Tomography
  • Produktbild: Atom Probe Tomography

Atom Probe Tomography Put Theory Into Practice

131,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

02.06.2016

Herausgeber

Williams Lefebvre + weitere

Verlag

Elsevier Science & Technology

Seitenzahl

418

Maße (L/B/H)

23,6/15,6/2,7 cm

Gewicht

804 g

Sprache

Englisch

ISBN

978-0-12-804647-0

Beschreibung

Rezension

"This book provides a combination of fundamental theory and practical information on atom probe techniques. This book can be used by both beginners and experienced researchers wanting to expand their knowledge in the area of atom probe tomogrophy. While providing the background and necessary fundamentals for the beginner to understand instrumentation, sample preparation, and the expected results that can be obtained, the advanced researcher will benefit from the wealth of information, including tables, references, and techniques found in a single resource." --IEEE Electrical Insulation Magazine

"The combination of theory and practical methods presented in this book make it a very useful resource for the new or seasoned surface scientist." --IEEE Electrical Insulation Magazine

Portrait

Williams Lefebvre, Ph.D., is Associate Professor, Materials Physics Group, University of Rouen, France. He received his Ph.D. in Materials Science in Rouen in 2001 for his correlative analysis by transmission electron microscopy and atom probe tomography (APT) of phase transformations in titanium aluminides. He earned a fellowship to the Japan Society for the promotion of science in 2002, when he visited the NIMS of Tsukuba. Since 2014, he has also been a visiting adjunct research associate professor at the University of Nebraska, Lincoln, USA, where has has been leading research activities in the field of physical metallurgy, focusing on light alloys systems, aiming at improving the methodology associated with the investigation of early stages of precipitation by APT and scanning transmission electron microscopy.Francois Vurpillot, Ph.D., has been Assistant Professor, Materials Physics Group (GPM), University of Rouen, France since 2003. After receiving his Ph.D. at the GPM in 2001, he spent one year at the Department of Materials at the University of Oxford, as a post-doctoral researcher funded by a Marie Curie fellowship support. He is the current vice-president of the International Field Emission Society (IFES) and leader of the Instrumentation team at the GPM. Francois Vurpillot pioneered the combination of experimental and simulated data in APT, which has been a breakthrough in the development of the technique for the nano analysis in material science.Xavier Sauvage, Ph.D., Senior Scientist, Materials Physics Group, University of Rouen, France defended his Ph.D. at the University of Rouen in 2001. The topic was utilizing Atom Probe Tomography (APT) in the investigation of phase transformations in nanoscaled composites processed by severe plastic deformation. After a post-doc position at the Max Planck Institut of Stuttgart, he was hired as research scientist at the Materials Physics Group, University of Rouen to lead some research on nanostructured materials. Dr. Sauvage is now leader of the Materials under Extreme Nanostructures and Energy research team, in which atomic scale microscopy techniques are used for the investigation of fundamental mechanisms in materials under extreme conditions like irradiation or severe plastic deformation.

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

02.06.2016

Herausgeber

Verlag

Elsevier Science & Technology

Seitenzahl

418

Maße (L/B/H)

23,6/15,6/2,7 cm

Gewicht

804 g

Sprache

Englisch

ISBN

978-0-12-804647-0

EU-Ansprechpartner

Elsevier B.V.
Radarweg 29
1043 NX Amsterdam
NL
productsafety@elsevier.com

Herstelleradresse

Elsevier Science & Technology
London Wall 125
EC2Y 5AS London
GB
tradeorders@elsevier.com

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Die Leseprobe wird geladen.
  • Produktbild: Atom Probe Tomography
  • Produktbild: Atom Probe Tomography

  • Introduction

    Chapter 1. Atom Probe Fundamentals

    Chapter 2. Field Ion Emission Mechanisms

    Chapter 3. Field Ion Microscopy

    Chapter 4. Specimen Preparation by Focused Ion Beam

    Chapter 5. Time of Flight Mass Spectrometry and Composition Measurements

    Chapter 6. Atom Probe Tomography Detectors

    Chapter 7. 3D Reconstructions

    Chapter 8. Laser Assisted Field Evaporation

    Chapter 9. Data Mining

    Chapter 10. Correlative Microscopy by APT and (S)TEM

    Chapter 11. Combining APT and Spectroscopy

    Conclusion

    Appendix

    Index