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Produktbild: Nyquist AD Converters, Sensor Interfaces, and Robustness
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Nyquist AD Converters, Sensor Interfaces, and Robustness Advances in Analog Circuit Design, 2012

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Beschreibung

This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces,...

Beschreibung

This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. 

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

21.11.2012

Abbildungen

X, 294 p.

Herausgeber Arthur H.M. van Roermund + weitere

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

21.11.2012

Abbildungen

X, 294 p.

Herausgeber
Verlag Springer Us
Seitenzahl

294

Maße (L/B/H)

24,1/16/2 cm

Gewicht

571 g

Auflage

2013

Sprache

Englisch

ISBN

978-1-4614-4586-9

Herstelleradresse

Springer-Verlag GmbH
Europaplatz 3
69115 Heidelberg
DE

Email: ProductSafety@springernature.com

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  • Produktbild: Nyquist AD Converters, Sensor Interfaces, and Robustness
  • Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.